a thesis in the record
Temperature-dependent extended electron energy loss fine structure measurements from K, L23, and M45 edges in metals, intermetallic alloys, and nanocrystalline materials
1993 · California Institute of Technology · doctoral · Applied Physics
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@misc{academicancestry_caltechthesis_caltechthesis_4941,
author = {{Academic Ancestry}},
title = {{Temperature-dependent extended electron energy loss fine structure measurements from K, L23, and M45 edges in metals, intermetallic alloys, and nanocrystalline materials: record of a thesis}},
year = {2026},
url = {https://academicancestry.org/thesis/caltechthesis/caltechthesis%3A4941},
note = {read on 2026-10-23}
}apa
Academic Ancestry. (2026, October 23). Temperature-dependent extended electron energy loss fine structure measurements from K, L23, and M45 edges in metals, intermetallic alloys, and nanocrystalline materials: Record of a thesis [Read on 2026-10-23]. https://academicancestry.org/thesis/caltechthesis/caltechthesis%3A4941