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Mechanical Characterization of Thin Films with Application to Ferroelectrics
2006 · California Institute of Technology · doctoral · Aeronautics; Applied Physics
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@misc{academicancestry_caltechthesis_caltechthesis_420,
author = {{Academic Ancestry}},
title = {{Mechanical Characterization of Thin Films with Application to Ferroelectrics: record of a thesis}},
year = {2026},
url = {https://academicancestry.org/thesis/caltechthesis/caltechthesis%3A420},
note = {read on 2026-10-22}
}apa
Academic Ancestry. (2026, October 22). Mechanical Characterization of Thin Films with Application to Ferroelectrics: Record of a thesis [Read on 2026-10-22]. https://academicancestry.org/thesis/caltechthesis/caltechthesis%3A420