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Analysis of Defect Structures in High Purity Copper Single Crystals Using X-Ray Topographic Techniques
1978 · California Institute of Technology · doctoral · Applied Physics; Physics
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@misc{academicancestry_caltechthesis_caltechthesis_3556,
author = {{Academic Ancestry}},
title = {{Analysis of Defect Structures in High Purity Copper Single Crystals Using X-Ray Topographic Techniques: record of a thesis}},
year = {2026},
url = {https://academicancestry.org/thesis/caltechthesis/caltechthesis%3A3556},
note = {read on 2026-10-24}
}apa
Academic Ancestry. (2026, October 24). Analysis of Defect Structures in High Purity Copper Single Crystals Using X-Ray Topographic Techniques: Record of a thesis [Read on 2026-10-24]. https://academicancestry.org/thesis/caltechthesis/caltechthesis%3A3556